Reliability and Failure Prediction: A New Take

August 3, 2017 Circuit Cellar Staff

HALT methodology has been a popular way to test harsh environment reliability. A new approach involves PCB design simulation for vibration and acceleration for deeper yet faster analyses. By Craig Armenti & Dave Wiens—Mentor Board Systems Division Many electronic products … Continue reading

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Single-Chip Battery Controllers Enable USB Power Delivery
Single-Chip Battery Controllers Enable USB Power Delivery

Texas Instruments (TI) has introduced a pair of highly flexible, single-chip buck-boost battery charge cont...

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Zero-Drift Op Amp Consumes Only 1.3 μAmps
Zero-Drift Op Amp Consumes Only 1.3 μAmps

Analog Devices,  which recently acquired Linear Technology, has announced the LTC2063 zero-drift op amp whi...